LNEYA工業用冷凍機 メーカー サプライヤー
ニュース
チップテストシステム解析 なぜチップテストなのか？
Functional failure means that a function point is not implemented. This is often caused by design. Usually, it is verified by simulation before the design stage, so usually a chip is designed and the simulation verification takes about 80% of the time. . Performance is not qualified, a performance indicator requires no clearance, such as 2G cpu can only run to 1.5G, digital-to-analog converter under the required conversion speed and bandwidth conditions, the effective number of eeno to reach ...
詳細を見る単一流体加熱冷凍システムの温度サイクル故障解析
The performance of single-fluid heating and cooling systems of different manufacturers is different. LNEYA is committed to creating a high-configuration single-fluid heating and cooling system to solve the problem of cooling and heating temperature control for users. How to solve the problem of temperature cycle failure in single-fluid heating and cooling system? ? The basic parameters of the temperature cycling of the single-fluid heating and cooling system are mainly six: 1 upper limit temp...
詳細を見る閉サイクル暖房システムの温度偏差の説明
If the temperature deviation occurs in the closed cycle heating system during use, it is necessary to check to see if there is any problem in each link, and solve the problem in time. In the steady state, the closed loop heating system displays the difference between the average value of the temperature and the average measured temperature at the center point of the workspace. (Note: The average display temperature here refers to the average display temperature of the temperature control inst...
詳細を見る低温テストチャンバー取扱説明書
The low temperature test chamber is a necessary test equipment in aviation, automobile, household appliances, scientific research and other fields. It is used to test and determine the parameters and performance of electrical, electronic and other products and materials after the temperature environment changes in high temperature, low temperature, or constant test.The low temperature test chamber can be used to check and determine the temperature cycling changes of electrical, electronic pro...
詳細を見る低温試験室と冷凍の違いは？
The low temperature test chamber, you can see by its name, probably means to do cryogenic test. It is more important in our refrigeration equipment. The small series of low temperature test chamber tells you that the refrigeration of low temperature test chamber under different refrigeration modes is also different. So what refrigeration modes are there? Let's have a look together with the low temperature test box.Different materials in different industries have different temperature requirem...
詳細を見るCore Maintenance Points of Ten High and Low Temperature Test Chamber Manufacturers
According to many years’ production experience of high and low temperature test chamber in Wuxi Guanya, it is found that many users are not very familiar with the maintenance of high and low temperature test chamber. As one of the top ten manufacturers of high and low temperature test chamber, Wuxi Guanya has sorted out the relevant maintenance points, and everyone pays attention to the analysis.Enterprise users need to have a comprehensive understanding of the products of ten manufacturers o...
詳細を見るHow to deal with chip failure in integrated circuit chip test?
The integrated circuit chip test is used in various chips, semiconductors, and component tests. Once the chip fails, the test work will stop. Therefore, the ineffective user of the integrated circuit chip test needs to know clearly. The purpose of integrated circuit chip failure analysis is to confirm the failure phenomenon of electronic components by various test analysis techniques and analysis procedures, to distinguish the failure mode and failure mechanism, and to confirm the cause of fa...
詳細を見るA new starting point for the development of semiconductor test devices
For a long time, due to the rapid development of integrated circuits, the component industry has been hampered by various constraints in materials and processes. Semiconductor and chip production testing is particularly important, so this is a new opportunity for LNEYA semiconductor test devices. Under the era of rapid development of integrated circuits, it is also calling for the emergence of domestic test equipment. Under such a background, LNEYA semiconductor test devices have been promote...
詳細を見るWhich industries are applicable to semiconductor device testing?
Semiconductor device testing is used in many semiconductor industries. So, how much do you know about semiconductors and conductors for semiconductor device testing? The properties of this substance are still recommended to the user. In general, substances can be classified into conductors, insulators, and semiconductors according to their electrical conductivity. The conductive properties of a substance depend on the atomic structure. Conductors are generally low-cost elements, such as coppe...
詳細を見るLNEYA半導体部品テストデバイス設計
The semiconductor component test device is used for high and low temperature test operation in the semiconductor and component industries. The LNEYA semiconductor component test device utilizes its advantages in the field of refrigeration and heating dynamic temperature control systems to produce semiconductor component test devices, which are compared in the industry. Big. When the semiconductor component tester system performs low temperature detection, the optical window on the vacuum low ...
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