Introduction of LNEYA Semiconductor Temperature Test System
The semiconductor temperature test system is an indispensable part of the semiconductor process. The LNEYA semiconductor temperature test system is dedicated to various semiconductor tests.
The semiconductor temperature test system runs through the whole process of chip design and manufacturing, and the subsequent test is the most important. The test yield rate is directly related to the production cost. LNEYA Semiconductor Temperature Test System, one of the semiconductor device testers, tests semiconductor products for the automotive, consumer, industrial, networking and wireless markets. Automotive-grade chips have higher requirements for testing, and are generally three-temperature test plus aging test. In recent years, with the rapid development of semiconductor technology, the precision of integrated circuits is getting higher and higher, and the requirements for semiconductor test equipment are getting higher and higher. The temperature test environment provided by the ordinary automatic sorting machine is very inaccurate and can no longer meet the requirements of today. The LNEYA conductor temperature test system came into being.
The hardware of the semiconductor temperature test system and the hardware of the interface part, the connection relationship of each part of the hardware and the temperature setting. Secondly, based on the common semiconductor temperature test system, the temperature control of the chip test is optimized by the simulation of fluid thermodynamics. The DTM concept is introduced, and the improvement of the fluid and temperature simulation is further improved, and the temperature of the test chip is controlled more reliably and accurately. It maintains its stability very well, and combines the temperature control cover with the DTM to further increase the temperature control level, thereby directly or indirectly improving the test yield. Fluid simulation software is used to guide the design of certain test hardware, reducing development cycle and cost.
LNEYA semiconductor temperature test system can be used not only in the semiconductor industry, but also in LNEYA test equipment for other chips and components. However, there are many types of semiconductor temperature test systems, which require users to choose their own living conditions.
(注:原文の一部は関連論文からの引用です。著作権侵害の場合は、削除いたしますので、お手数ですがご連絡ください)
関連推奨品
-
低温運転試験におけるチラー冷却システムの注意事項
1198There are certain differences in the use method, function, structure, etc. of different types of chiller cooling systems for low-temperature operation test. The chiller of the industrial low-temperature operation test requires heat to be generate...
詳細を見る -
蒸留による溶剤回収の温度管理は?
10731. If the product quality is not affected by the presence of air at a higher temperature, it can be recovered at normal pressure first, and when the temperature exceeds the normal pressure boiling point of the desolvent by 10 degrees, when the so...
詳細を見る -
高温低温試験機の価格分析
1053諺にもあるように、"支払ったものは手に入る"。「高温・低温試験機の価格は、その構成の質に関係しています。無錫LNEYAの技術そのものに価値がある。テスト・チャンバー業界では、高温・低温のテスト・チャンバーは、その性能の高さから、高い評価を得ています。
詳細を見る -